Semiconductor test engineers can expect to increasingly confront problems related to RF, memory, and compression-based-scan test; timing and jitter measurements; design for manufacturability (DFM); ...

Scan technology enables high levels of defect detection using automated tools. Each D flip-flop (DFF) or latch in the circuit under test is implemented as an equivalent sequential element called a ...

The enhanced TRITON scan tool support provides comprehensive resources for professional technicians, Snap-on said.